详情
特点
- Automatic zero offset voltage calibration across photodiode for ultra-low dark current
- Monolithic integration of 256-channel ADC and photodiode array in one sensor
- Integrated reference voltage and bias current generator for low bill of material
- Two power modes for min. integration time of 80 μs and 200 μs
- Calibration mode for external linearity calibration
- Customization of pixel dimensions on request
优势
- Ultra-low dark current of max. 1 pA
- Lowest input related noise of max. 0.36 fC at 200 nA input range
- Fast integration time of min. 80 μs
- Low power dissipation of 1.23 mW/Ch at 200 μs and 1.46 mW/Ch at 80 μs
- High ADC linearity of ±600 ppm including photodiode
- 110 MHz LVDS interface for data streaming
产品参数
通道
输入
256
积分时间
最小值
80
µs
输入相关噪声
典型值
0.36
单通道功耗
最小值
1.23
mW
分辨率
26
bit
封装
module on substrate
功能
x-ray sensing
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更多 计算机断层扫描ct与x射线传感器
借助高品质的传感解决方案,CT与X射线传感器设备能够以更高对比度呈现更精确的图像,同时限制了噪点和失真的出现。